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iSQI Exam CTFL_Syll2018 Topic 6 Question 10 Discussion

Actual exam question for iSQI's CTFL_Syll2018 exam
Question #: 10
Topic #: 6
[All CTFL_Syll2018 Questions]

Which defect below is MOST likely to be found by a review during static testing?

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Suggested Answer: A

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