iSQI Exam CTAL-TM_Syll2012 Topic 1 Question 75 Discussion

Actual exam question for iSQI's CTAL-TM_Syll2012 exam

Question #: 75
Topic #: 1

[All CTAL-TM_Syll2012 Questions]

Which of the following information would you expect to be the most useful to perform a defect clustering analysis?

K2 1 credit

AThe trend in the lag time from defect reporting to resolution

BThe defect component information

CThe lifecycle phase in which the defect has been introduced

DThe defect removal efficiency information

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Suggested Answer: C

by Daniel at Dec 07, 2024, 10:01 PM

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8 hours ago

I agree with Sue. Knowing how long it takes to resolve defects can help identify patterns.

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3 days ago

I think the trend in the lag time from defect reporting to resolution would be the most useful.

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