iSQI Exam CTAL-TA Topic 5 Question 36 Discussion

Actual exam question for iSQI's CTAL-TA exam

Question #: 36
Topic #: 5

Which of the following type of defects is most likely to be detected by using orthogonal arrays?

ADefects found by interaction between system and operation environment

BDefects in business processes

CDefects for a range of related values

DDefects caused by the interaction of two variables

Show Suggested Answer

Suggested Answer: D

by Mozell at May 05, 2022, 06:14 AM

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